![]() Scattering protectors available, reducing the background at low angles. Detector: HyPix–3000 hybrid pixel 2-dimensional detector (0D, 1D and 2D mode available) with 38.5 mm x 77.5 mm active area spatial resolution 100 μm x 100 μm per pixel > 10 6 cps/pixel count rate.RxRy attachment head providing sample orientation adjustment e.g., when executing in-plane or RSM measurements. Attachment head mounted on the Phi axis of the XY attachment head provides area-map measurements. Goniometer System and Sample Stage: High-precision theta-theta goniometer featuring a horizontal sample mount 3-axes attachment platform for thin film sample measurement with χ (tilt), Z (height) and φ (rotation).Receiving Optics: Parallel slit analyzer (PSA 0.228°) for GIXRD (in-plane and out-of-plane) parallel slit analyzer (PSA 0.5°) for thin films (in-plane and out-of-plane) and receiving Soller slits.Incident Optics: Cross beam optics (CBO) and selection slits switching a direct beam for focusing optics (Bragg-Brentano optics) and a monochromated parallel beam using a paraboloidal multilayer mirror Ge (440) 4-bounce monochromator incident soller slits micro area selection slits length limiting slits and collimators (incl.Sealed-off Cu anode X-ray tube, Ceramics: max 2.2 kW Long fine focus.Texture analysis (out-of-plane and in-plane pole figure measurements) on materials with a preferred orientation of the crystallites.Out-of-plane and in-plane Grazing Incidence X-ray Diffraction (GIXRD) on thin films.2D XRD measurements and Wide Range (2D) RSM using HyPix3000 detector.Reciprocal Space Map (RSM) measurements.High-resolution rocking curve analysis on epitaxial layers.X-ray Reflectivity (XRR) to evaluate layer thickness, density, and surface roughness.Phase ID (search match), crystallinity, crystallite size, and microstrain analysis.Low background measurement and XRF reduction mode of the 2D detector. Measurement in Bragg-Brentano (0D and 1D). ![]()
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